G01R35/04- Testing or calibrating of apparatus covered by the other groups of this subclass of instruments for measuring time integral of power or current.G01R35/00- Testing or calibrating of apparatus covered by the other groups of this subclass.G01R31/50- Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections.G01R31/00- Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere.G01R- MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES.238000004519 manufacturing process Methods 0.000 description 1.238000005516 engineering process Methods 0.000 description 2.230000001264 neutralization Effects 0.000 claims description 8.238000006243 chemical reaction Methods 0.000 claims description 17.238000010248 power generation Methods 0.000 claims description 25.230000001172 regenerating Effects 0.000 claims abstract description 11.238000005259 measurement Methods 0.000 title claims abstract description 17.Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.) Filing date Publication date Priority to KR1020150009070A priority Critical patent/KR101586460B1/en Priority to KR10-2015-0009070 priority Application filed by 주식회사 신동파워텍 filed Critical 주식회사 신동파워텍 Publication of WO2016117781A1 publication Critical patent/WO2016117781A1/en Links Inventor 신동구 Original Assignee 주식회사 신동파워텍 Priority date (The priority date is an assumption and is not a legal conclusion. Google Patents WO2016117781A1 - Two-way measurement device for scott transformer and measuring method in measurement device for scott transformer WO2016117781A1 - Two-way measurement device for scott transformer and measuring method in measurement device for scott transformer
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